383 Assessing deep learning artefact bias using global saliency.

Journal of Investigative Dermatology

J. Pfau, A.T. Young, M. Wei, M.J. Keiser. 383 Assessing deep learning artefact bias using global saliency. Journal of Investigative Dermatology. 2020 Jul 1; 140(7):s49.

2020
https://researcherprofiles.org/profile/153401996

J. Pfau, A.T. Young, M. Wei, M.J. Keiser